Used RUDOLPH AUTO EL III #9048250 for sale

RUDOLPH AUTO EL III is a computer-controlled optical ellipsometer that utilizes polarized light to measure thin film thickness, refractive index, extinction coefficient and other parameters of materials with precision and speed. It is designed to measure the optical properties of materials with great accuracy and repeatability and has been used in research and development for many years. RUDOLPH AUTOEL III is designed to measure within 0.4° angular accuracy with up to 0.01 nm resolution in standard samples. It can measure samples between 80- 140 μm in thickness and has a wide range of materials such as gallium arsenide, glass, and plastic. AUTO EL III utilizes a precise monochromator system for the selection of light sources that can be used to analyze a range of film thicknesses for various materials and materials having different coating compositions. Its integrated microscope, diaphragm adjustment, and computer-controlled analysis of data allows for accurate ellipsometric readings for samples with thicknesses < 50 nm. AUTOEL III is housed in a self-contained bench-top instrument with a bright LED illumination system, automated sample gripping, and an intuitive computer interface. The user can easily load samples and begin the ellipsometry measurements and analysis. The computer interface contains an extensive database of material label parameters, including refractive indices, extinction coefficients and palette functions. RUDOLPH AUTO EL III has a host of features for users of thin film materials, including a wide dynamic range, built-in environmental protection, and a real-time monitor for temperature and humidity control. Additionally, RUDOLPH AUTOEL III has a range of automatic optical control systems that can be used to determine optimal optical constants for the user's specific application. AUTO EL III is a powerful, precise, and easy-to-use instrument for the accurate characterization of thin film materials. Its detailed accuracy and repeatability provide researchers and developers with a valuable tool for the analysis of thin film properties. Its range of features and automated software also make it an ideal ellipsometer for a variety of research and development applications.