Used RUDOLPH AUTO EL III #9100217 for sale

RUDOLPH AUTO EL III is a state-of-the-art ellipsometer capable of measuring the optical properties of a wide range of surfaces. It is an incredibly versatile tool that is used in the research and development fields, in optics and material science laboratories, and in industry and manufacturing. RUDOLPH AUTOEL III is capable of measuring the index of refraction, ellipsometric angles psi, delta, and thickness of a wide range of samples with a high degree of accuracy, repeatability, and sensitivity. AUTO EL III is capable of measuring transparent and non-transparent samples from 5 nm to 200 μm with an accuracy of +/- 0.1 nm. It is also equipped with a quartz crystal microbalance for measuring thin films down to 0.5 nm. For transparent samples, AUTOEL III can measure refractive index (n) and extinction coefficient (k). The ellipsometer has a wide range of illumination sources, including a cold light source, holography projection light source, and laser alignment source. RUDOLPH AUTO EL III is also equipped with a variety of features and accessories to better suit the special needs of its users. These include an automated sample stage, an Automated Incident Angle Selection (AISA) system, and a variety of software packages to analyze and report the data. The AISA system allows users to select and optimize the incident angle without manual intervention. The software packages are designed to analyze both single wavelength and wavelength-dependent polarimetric data and can be used for both static and dynamic measurements. RUDOLPH AUTOEL III is a highly automated instrument and is capable of performing measurements in a wide range of applications from reflective, non-reflective and anisotropic to metal surfaces, textured and periodic surfaces, multilayers, cosmetics and other optical materials. It can also measure capacitance, resistivity, and film resistivity at up to 10 point steps. Overall, AUTO EL III is an incredibly versatile and powerful tool for measuring the optical properties of a range of materials and thin films. With its combination of advanced hardware and software features, ease of use, and high precision, it is an ideal choice for measuring thin film samples in both research and manufacturing applications.