Used RUDOLPH AUTO EL III #9205167 for sale

RUDOLPH AUTO EL III is an automated ellipsometer that provides a comprehensive and accurate methodology for measuring the optical properties of thin-film films and multilayer coatings. The equipment has been designed to provide accurate and reliable results for a wide range of materials, including metals, semiconductors, polymers, and organics. The system uses a CCD-camera in combination with a microscope, connected to a computer, to measure the change in reflected light, passing through different layers of a material. Both the angles of incidence and the polarization of the light can be accurately set and monitored by the unit. RUDOLPH AUTOEL III offers a wide range of capabilities and can be used for a variety of applications. This includes measurements related to coating deposition, layer quality, and layer thickness. The machine can also be used to determine the optical constants (refractive index and extinction coefficient) of the material. It can be used to analyze dye-solution or filter-stack layers with layer thicknesses less than 200 A°. The tool is designed to be extremely simple and versatile, allowing users to quickly and accurately measure the film properties of any interface needing analysis. The asset consists of a main controller, a optical head, a CCD camera, a spectro-ellipsometer, and a microscope. The main controller allows users to select the best parameters for their applications, such as the wavelength range, angular range, step size, noise reduction filters, and measurement range. It also allows users to control the ellipsometer's light sources, software, and the movement of the optical head. The optical head, CCD camera, and microscope allow users to accurately measure the optical properties of the interface. The wavelength range of AUTO EL III is adjustable, meaning users can measure optical properties over a wide range of wavelengths. The angular range of the ellipsometer is also adjustable from 0-90°, meaning that samples can be measured at any desired angle. The spectro-ellipsometer measures the polarized light passing through the sample, and the amount of light that is reflected. The ellipsometer parameters are calculated via software, and the signals are displayed in the form of analysis graphs. The data is then analyzed in terms of optical constants and layer thickness, among other parameters. In conclusion, AUTOEL III provides an accurate, reliable, and versatile method for measuring thin-film film and multilayer layer coatings. The model has been designed to provide measurements over a wide range of wavelengths and angles. It also allows users to select the best parameters for their application, ensuring accurate results every time.