Used RUDOLPH AUTO EL IV #293628933 for sale

RUDOLPH AUTO EL IV is an automatic ellipsometer designed for accurate and rapid measurements of optical anisotropy on various types of surfaces. It is one of the most advanced instruments of its kind, allowing users to easily measure, characterize and control the optical properties of materials. It features a wide range of wavelength selectivity, including the ability to measure both visible and near-infrared regions simultaneously. The instrument is also capable of accurately measuring spectral reflections and transmittance of the sample. RUDOLPH AUTOEL IV utilizes an imaging ellipsometer to measure the refracted angles of light as it passes through sample surfaces. It is equipped with a four-wavelength laser source that can be used to analyze different sample materials. This system also includes a polarization controller and polarizing beamsplitters for controlling the polarization direction of the incident light. The angular spectrum of the light passing through the sample is then collected by a probe with a linear-in-angle diode array detector and sent to high speed data acquisition and analysis system for measurement. The analysis software that comes with AUTO EL IV allows for the automatic calculation of the various optical parameters such as thickness, refractive index, dielectric constant and absorption coefficient from the measured data. It can also be remotely operated through the user interface, and allows for the automated analysis of multiple samples. This makes the instrument ideal for research and production environments that require fast measurements of a large number of samples. AUTOEL IV has a wide range of customizability, allowing users to tailor the system to their specific applications. It features temperature control, digital and analog inputs, multiple-beam configuration, automated image mapping capabilities and many other advanced capabilities. It also has an IP editor for easily editing parameters online. All in all, RUDOLPH AUTO EL IV is one of the most advanced ellipsometers on the market, able to simultaneously measure a variety of optical parameters on various materials and surfaces. It provides a reliable and efficient method of measuring, analyzing and controlling optical properties.