Used RUDOLPH AUTO EL IV #83913 for sale

RUDOLPH AUTO EL IV is an optical instrument used to measure thin film thickness and other optical properties. It uses the ellipsometric technique, which is a non-destructive method of measuring the thickness, optical constants, and refractive indices of thin film materials. It is an automated system, which utilizes a low-angle polarized light source, a polarizer, a high-accuracy rotatable analyzer and a detector. The light source is focused through the polarizer station where the light is randomly polarized. The analyzer station is then used to select the desired polarization response of the sample surface through its rotation and lock the desired orientation. The light polarized through the analyzer then impinges onto the sample surface and is reflected back to the detector. The detector then measures the intensity of the reflected light and the angle of rotation of the analyzer to determine the parameters. RUDOLPH AUTOEL IV offers a wide range of advantages, such as rapid and accurate behavioral analysis of thin film surfaces in real-time. It can assist in the selection of near optimal deposition conformations or in the evaluation of changes in the optical properties of materials exposed to temperature, light or electrical stimuli. In addition, the detector automatically compensates for errors due to the influence of drifts in temperature or light source intensity. Furthermore, the instrument is equipped with the software which simultaneously supports multiple protocols, including contrast measurements and Brewster Angle measurements, ensuring a high degree of accuracy and repeatability. The software also offers advanced automation and data processing capabilities and allows for the calibration of optical properties such as refraction, absorption and colorimetric values. AUTO EL IV can be used for a variety of applications including thin film optical analysis, material surface analysis, optical diagnostics and reference measurements. It is especially suitable for the use in material science where the thin film characterization is demanded in various experiments. The instrument has become the industry standard for accurate thin film characterization due to its speed, accuracy and reliability.