Used RUDOLPH AUTO EL IV #9086419 for sale

RUDOLPH AUTO EL IV is an ellipsometer designed for advanced materials and thin film metrology applications. The instrument uses polarized light to measure the optical properties of samples, such as the thickness of layers or optical constants of thin films. The compact, easy-to-use system features a high-performance computer, intuitive software interface, and a range of automated metrology tools. This allows the user to rapidly measure and analyze delicate samples with highest precision and accuracy. RUDOLPH AUTOEL IV offers a wide range of measurement modes and capabilities. It is designed to measure surface topography, thin film coating layers and optical properties of substrates, such as optical constants, optical constants of single and multi-layer systems and optical constants of reflective, transparent, and absorbing layers. As such, the instrument is ideal for applications involving solar cells, organic light-emitting diodes, optical filters, waveguides, liquid crystals, nanostructured materials, and other thin film deposition processes. The instrument can measure a variety of physical properties, such as surface topography, refractive indices, film thicknesses, optical constants, and optical constants of multilayer systems. Additionally, it is capable to automatically actuate and acquire data over a number of different frequencies. This feature allows for a much higher resolution and dynamics compared to other traditional instruments. Additionally, the system features an LED monitor, which allows for rapid visual analysis of acquired data. AUTO EL IV employs a modern optical design, along with a computer-compatible interface. A number of advanced features, such as automatic data acquisition, use of variable angles of incidence, and an automatic range-matching set-up, make this instrument highly efficient and capable. AUTOEL IV provides a high-level of accuracy, speed, and precision with its advanced functionality. Its easy-to-use features ensure quick and reliable results. This makes it an ideal choice for quality control and research laboratories involved in the study or measurement of optical properties of thin film coatings.