Used RUDOLPH AUTO EL IV #9105735 for sale

RUDOLPH AUTO EL IV is an ellipsometer designed for use in the fields of optics, semiconductor materials, and thin film analysis. This instrument is capable of measuring the optical parameters of thin films such as thickness, refractive index, and extinction coefficient with both wavelength and polar angle range scanning. RUDOLPH AUTOEL IV is an automated modular ellipsometer system that allows operators to accurately measure thin films and analyze the optical data. It has an effective dynamic range that is ideal for thicker films with an extended wavelength range of 190-1700nm for normal and angle dependent film characterization. AUTO EL IV uses an automated data acquisition sequence controlled by a user-friendly software program. The software includes presets and parameter settings for a range of thin film types and materials. This feature allows the user to accurately and efficiently analyze results regardless of the film's complexity. The instrument is also equipped with a 19" touchscreen monitor that reads the output data in real-time and provides an intuitive user interface with a graphical display. The user can control and modify the parameters directly from the display and monitor the results as they are measured. The company also offers a range of accessories to enhance the instrument's precision and accuracy. These can include a range of rotation stages for sample handling, a temperature controller for temperature dependent film properties, and a sample holder for automatic measurement of the films. They also provide a range of other options for increased accuracy and resolution such as a dual wavelength polarimeter and an ASIC detector. AUTOEL IV is the perfect tool for anyone in the optoelectronics and thin film analysis industry. With its advanced features and user-friendly interface, this instrument is an ideal solution for obtaining accurate results with minimal input effort.