Used RUDOLPH AUTO EL IV #9205166 for sale

RUDOLPH AUTO EL IV is a highly advanced ellipsometer designed to measure the optical properties of thin films and surfaces. It employs a laser source to measure the ellipticity and polarization of the light reflected off the surface being studied. This allows researchers to accurately analyze the thickness, refractive index and surface roughness of the sample in a highly precise manner. RUDOLPH AUTOEL IV has an intuitive and user-friendly interface, making it easy to operate for both experienced and inexperienced users. It's also capable of automatic calibration, ensuring accurate measurement and reliability. This equipment includes an extensive library of sample analysis software, which enables researchers to quickly obtain detailed information about their samples. AUTO EL IV's sample stage can be freely moved in the x-y-z directions, allowing researchers to adjust the sample's position for precise measurements. It also features a built-in thermal control system, which helps maintain a stable temperature even when the sample under test moves. AUTOEL IV's sophisticated optics unit is designed to detect even the slightest changes in the state of polarization of the light reflected from the sample. The machine's automatic goniometer quickly rotates the sample to allow the tool to take numerous precise measurements in a fraction of the time of manual goniometry. Data from RUDOLPH AUTO EL IV can be transferred directly to a computer via a USB or RS-232 port. This enables researchers to quickly gather and analyze extensive data sets. The asset is also capable of high speed measurements, with data acquisition rates of up to 1000 points/second. RUDOLPH AUTOEL IV includes a wide variety of applications such as thin film characterization, monitoring of deposition or etching process, surface roughness measurement and ellipsometric mapping of surfaces. Its flexible design makes it suitable for a wide range of research applications. In summary, AUTO EL IV is a high-precision ellipsometer designed to precisely measure optical properties of thin films and surfaces. It has an intuitive user interface, a built-in thermal control model, a high speed data acquisition rate, and comes with a variety of applications designed to fit the needs of different research projects.