Used RUDOLPH AUTO EL (NIR-3) #9122499 for sale

RUDOLPH AUTO EL (NIR-3) is an automated ellipsometer manufactured by RUDOLPH Research Analytical. It is a non-contact optical instrument for measuring the thickness, composition, optical constants and related parameters of thin-film materials. It works by combining real-time spectroscopy, imaging and data analysis to measure a variety of properties of thin-film surfaces in a wide range of applications. RUDOLPH AUTO EL is powered by an integrated Near-Infrared (NIR) source, which selectively irradiates a thin-film sample with light in wavelength ranges between 700 and 2300nm. This light is then reflected off the sample's surface and collected by the integrated NIR spectrometer. Through spectroscopic measurements, these optical signals provide detailed information about the refractive indices, extinction coefficient, layer thickness, and other parameters of thin-film materials. The instrument is equipped with multiple cameras for recording high-resolution images of the sample's surface. The integrated imaging system is controlled by a state-of-the-art autofocus and magnification motor system, allowing for precise alignment of the optical components for accurate measurement. RUDOLPH AUTO EL is a fully automated unit consisting of two stages: a sample loading and preparation stage and an analysis stage. Sample preparation is easy and efficient. The integrated loader automatically handles most substrates including wafers up to 1" tall via an optional rotating platform. To analyze the sample, RUDOLPH AUTO EL incorporates algorithms which allow for rapid and precise measurement of the sample's n and k values, as well as layer thickness profiles. It can also measure a range of other optical constants including extinction coefficient, film thickness, sideways gloss, refractive index, partial photon density of states, and extinction ratios. The instrument is factory-calibrated for accuracy and robustness, and is compliant with SEMI and ASTM standards. Additionally, RUDOLPH AUTO EL can be used in conjunctions with third-party controllers, enabling advanced automation and control of the instrument. Overall, RUDOLPH AUTO EL (NIR-3) provides researchers and technicians with a reliable, automated solution for measuring the properties of thin-film materials. The easy-to-use design and integrated tools allow for efficient and accurate measurement of complex thin-film samples.