Used RUDOLPH AUTO EL #293615479 for sale

RUDOLPH AUTO EL is a state-of-the-art surface science ellipsometer that has been developed to provide a simple and precise characterization of thin film thickness and optical constants. Its intuitive user parallel control software allows for fast and accurate measurements. The system is highly automated and includes a unique low-elevation daylight optical head and a motorized actuator for precise angular positioning. RUDOLPH AUTOEL measures and calculates the thickness and optical constants of thin films by examining the polarization of light reflected off the film. The thin film is mounted on a sample stage and is illuminated with a polarized light source. A detector measures the reflected light and the changes in polarization caused by the film. AUTO EL software then calculates the film optical constants from the changes in polarization. This ellipsometer offers a variety of features designed to simplify the process of thin film thickness and optical constants determination. It can be used to measure thin films as thin as 25 angstroms, with a maximum variation of 0.25%. AUTOEL includes a temperature-controlled sample stage that enables the user to measure films at different temperatures. Additionally, its advanced motorized optics and automated sample positioning provide fast and precise radial alignment of any sample. RUDOLPH AUTO EL also includes advanced software capabilities, including graphic representation of film thickness results over substrate substrates and a multi-layer thin film model that allows the user to analyze the optical properties of multiple layer films. This system is highly precise and accurate, and is suitable for a wide range of applications, including thin film development, optical characterizations, and quality control. It is also designed with an optional integrated Spectroscopic Ellipsometry (SE) module, which incorporates FDTD technology to measure the complex index of refraction and extinction coefficient of thin film materials. This advanced SE module allows for the mapping of spectroscopic ellipsometric parameters across the sample. Overall, RUDOLPH AUTOEL is highly advanced and sophisticated surface science ellipsometer system that offers a precise and accurate thin film thickness and optical constants determination. It is an ideal solution for thin film characterization, optical characterizations, and quality control.