Used RUDOLPH AUTO EL #293630394 for sale

Manufacturer
RUDOLPH
Model
AUTO EL
ID: 293630394
Ellipsometer.
RUDOLPH AUTO EL is a high-precision, automated ellipsometer for the measurement of optical thin-film materials. It is a valuable tool for characterizing a wide array of materials, from semiconductor wafers to compact disks. RUDOLPH AUTOEL is a fully automated measurement equipment that can be used for both static and dynamic measurements. It is controlled by a software package, allowing for both manual and automated control of the system. The features of the unit include a variable angle of incidence detection machine, a variable angle of incidence two-beam ellipsometer, a variable angle of incidence variable-angle reflection ellipsometer, a variable angle of incidence variable-angle transmission ellipsometer, and a scanning angular rate ellipsometer. The tool is capable of obtaining accurate measurements on a variety of thin-film materials, including those with complex refractive indices and surface roughness. AUTO EL uses a white-light source which is automatically tuned to the desired measurement wavelength, and combined with a laser source for a more precise measurement. Data acquisition can be done in both static and dynamic modes, allowing for measurements over a broad range of angles, and with varying speed settings. The asset features an advanced software suite for both manual and automated control and data processing. This includes an automated command set from which measurements can be carried out in manual or fully automated mode. This software also includes real-time plotting and tabular display capability. Additionally, the software is equipped with a built-in calibration function. AUTOEL is an effective, versatile, and reliable ellipsometer for thin-film measurements. It features a wide-angle of incidence field of view with high sensitivity, and is capable of measuring a variety of thin-film materials. This model is an ideal option for various research and industrial applications, and provides accurate and reliable measurement results on thin films.
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