Used RUDOLPH AUTO EL #9048965 for sale

RUDOLPH AUTO EL is an automated ellipsometer specifically designed to measure the optical properties of thin film materials. This device uses light to measure the refractive index, extinction coefficient, and the thickness of thin films. It can be used for a wide range of materials, including polymers, metals, semiconductors, and biological samples. RUDOLPH AUTOEL is a state-of-the-art, high-precision ellipsometer that provides accurate data with fast sample analysis and real-time image capture. AUTO EL operates by measuring the change of polarization of monochromatic light when it passes through a film of material. The angle of incidence of the light and the angle of refraction are measured in terms of the polarization ratio. The device is capable of providing measurements of the refractive index, extinction coefficient, and thickness of the film. Additionally, the device is equipped with a system of automated data analysis, including a graphical display and numerical manipulation, allowing the user to instantly detect any material defects or variations. AUTOEL is also equipped with a user-friendly software package, allowing for quick optimization of the device's parameters through a special graphical user interface (GUI). This user-friendly package enables the user to make rapid adjustments and optimize the measurements based on the material and the experimental requirements. In addition, the software can store and process the acquired experimental data for future analysis. RUDOLPH AUTO EL is relatively simple to operate and can be used both in a laboratory setting and with portable units. Additionally, its adjustable sample chamber and adapter allow for precise alignment of the sample surface while the adjustable light source can be aligned for optimal illumination. The device also incorporates a conveniently located autofocus feature for easy and precise alignment of the sample surface. In summary, RUDOLPH AUTOEL is an automated ellipsometer designed for measuring the optical properties of thin film materials with high precision. Its adjustable sample chamber and adapter, adjustable light source, and autofocus feature enable it to be used with a variety of samples in different settings. Additionally, its user-friendly software package allows for quick optimization, as well as easy storage and manipulation of the acquired data.