Used RUDOLPH AUTO EL #9196403 for sale

RUDOLPH AUTO EL is a highly accurate and precise scanning ellipsometer designed for both research and industrial applications. RUDOLPH AUTOEL offers a fast, reliable, and easy to operate solution for characterizing thin film or surface properties. The optical head is mounted on a quartz beam stabilizer for stable, consistent results, and its low-noise electronics and software make it well suited for laboratory applications. AUTO EL measures changes in the polarization states of light reflected from the sample's surface. With this, it can determine the optical constants of thin films such as refractive index, absorption, and extinction coefficient. AUTOEL also measures the layer thickness of an film, both homogenously and non-uniformly. RUDOLPH AUTO EL is optimized for measuring a wide variety of materials, such as metals, ceramics, semiconductors, and polymers. Its high-speed scan can handle samples from the size of a human hair up to 30 cm. Thanks to its software, the data can easily be stored and analyzed, allowing users to quickly evaluate the properties of various thin film combinations. RUDOLPH AUTOEL is designed to be reliable, robust, and durable. Its solid design can handle rough handling during transportation and even withstand extremes in temperature and vibration without impeding performance. To ensure data such as phase shift and reflectance measurements are accurate, AUTO EL is calibrated with a laser scan every 50 hours. AUTOEL's user-friendly desktop interface allows it to be easily integrated in any existing research or industrial process. The data can be exported and retrieved for further processing and analysis. In addition, any changes in temperature or vibration can be compensated for to make sure measurements are always accurate and consistent. Overall, RUDOLPH AUTO EL is a reliable and accurate scanning ellipsometer designed for research and industrial applications. Its robust design and advanced software capabilities make it an ideal solution for characterizing thin film or surface properties. The high-speed scan and reliable calibration measures ensure reliable and consistent measurements every time.