Used RUDOLPH AUTO EL #9259748 for sale

Manufacturer
RUDOLPH
Model
AUTO EL
ID: 9259748
Vintage: 1998
Ellipsometer 1998 vintage.
RUDOLPH AUTO EL is an ellipsometer that uses advanced optics and spectroscopic techniques to measure optical properties of thin films such as film thickness, refractive index, extinction coefficient and reflectance. The ellipsometer uses angles of incidence and polarisation to measure the reflectance of a sample with the highest accuracy. It avoids contamination with its enclosed optics and ensures the repeatability of measurements for very small samples. The ellipsometer operates in the visible and NIR range (400 - 1650 nm) and its fast scan mechanism offers fast and reliable measurements. The ellipsometer is housed in modern aluminum casing with a large LCD display which provides a clear and concise data display. It also features a USB port and a removable USB drive allowing for easy data storage and sharing. The software that accompanies the ellipsometer is comprehensive and allows for a variety of parametric display options and post-processing of data for statistical analysis. The ellipsometer includes an automated sample handling system which allows for easy loading and unloading of samples from the measurement chamber, as well as automatic alignment of samples to the optics. This ensures correct sample placement and minimizes operator error. The auto alignment feature also offers an easy way to ensure accurate and reproducible data acquisition. An automated cleaning cycle ensures surface preparation prior to measurement, which eliminates interfering substances and assures pinpoint accuracy. RUDOLPH AUTOEL offers precise and reliable measurements thanks to built-in nanometer-level position control. It performs measurements accurately and quickly, with an optical resolution of 0.1° and a standard measurement angle of 0.1° to 5°. The ellipsometer offers a wide range of measurements including film thickness, surface topography, scratch imaging, and reflectance. Additionally, the ellipsometer features an intuitive user interface, with its analysis techniques easily displayed graphically on the LCD display. The powerful software allows addition of further options such as automated scan routines and parameter sweeps. Its flexibility gives users the ability to customize settings and to sort data in different ways. Overall, AUTO EL is a highly advanced ellipsometer that offers superior accuracy and repeatability due to its high-precision positioning system and automated sample handling. It is suited for measuring optical properties of thin films in the visible and near-infrared spectrum, with an accuracy of up to 5nm. The intuitive LCD display and comprehensive software make AUTOEL a great choice for a variety of applications in film thickness characterization and process monitoring.
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