Used RUDOLPH AUTO EL #9386652 for sale

RUDOLPH AUTO EL is a precision instrument used for analyzing thin film materials. The ellipsometer measures the optical properties of thin film materials such as semi-conductors, transparent films, and metals with an angular accuracy of 0.001°. By measuring the change in polarization of light as it passes through a thin film layer, the ellipsometer can determine the thickness, refractive index, extinction coefficient, optical absorption, and other optical properties of the material. RUDOLPH AUTOEL operates by using the principle of ellipsometry. This principle states that when a linearly polarized light is incident upon the surface of a material, the direction of the polarization of the light changes. This change is dependent on the thickness and optical constants (refractive index, extinction coefficient, etc.) of the material. AUTO EL is designed with a user friendly operation equipment. It has an automated sample positioning and alignment system that can be preset to measure any sample size from 0.2-2mm. The sample is then placed onto a platform that is automatically guided into place, allowing for efficient measurement of multiple samples. The instrument also features a software package that enables multiple sample measurements to be taken in one single self-contained unit. It allows for the comparison of multiple layers in both time and angle modes and has a data storage capacity of up to 15,000 samples. This allows for rapid analysis and efficient analysis of wide varieties of films. AUTOEL also has an RS-232 interface for easy integration of the instrument into external network systems or data acquisition software. This allows for quick and easy communication with other instruments or computers, allowing for easier data analysis or further processing. RUDOLPH AUTO EL is a reliable ellipsometer that allows users to measure thin film materials with an accuracy of 0.001°. Its automated operation ensures that sample measurements are taken quickly and efficiently, and its software package allows for multiple sample measurements in a single machine. The instrument also features a RS-232 digital interface for easy integration with external systems. This allows for quick and reliable measurement and analysis of thin film materials.