Used RUDOLPH EL III #9131119 for sale

RUDOLPH EL III is a state of the art ellipsometer for optical thin film measurements. It is used for the measurement and analysis of optical thin film layers, such as those found in the production of advanced semiconductor devices, optical displays, and other optoelectronic components. Ellipsometry utilizes a precision light source and a photo detector to measure the change in the polarization of light after it interacts with a thin film. EL III combines the advanced measurement capabilities of a high-end polarized reflectometer with the powerful control and analysis software of an ellipsometer to provide researchers and engineers with unparalleled precision and accuracy. RUDOLPH EL III features an advanced automated measurement system, which accurately adjusts the wavelength of the source light and polarization angles for optimal sampling of thin films. This powerful system also provides a calibration module to effectively eliminate instrument drifts and ensure accuracy across a variety of samples. EL III also offers an array of environmental scanning capabilities, including temperature and humidity control, which make it perfect for standalone measurements. In addition to its remarkable measurement capabilities, RUDOLPH EL III also offers a variety of powerful analysis options. Its latest Windows-compatible software is used to interpret sample data by applying a range of sophisticated algorithms to the collected data to generate a variety of useful parameters, such as optical constants, refractive indices, absorptions coefficients, and film thickness. Furthermore, data can be output directly in either text or graphics format for comparison with Ellipsometry Standards Committee (ESC) standards. Finally, EL III is designed with the user in mind, making thin film measurements as easy as possible. An intuitive graphical user interface makes setup and operation of RUDOLPH EL III a breeze, and a selection of useful wizards and tutorials ensures that even new users can quickly learn the instrument's operation. EL III also ships with a range of useful accessories, such as semi-automatic sample stages and reference sample holders, to make optical thin film measurement and analysis even more effortless and successful.