Used RUDOLPH FE 7-D #9142687 for sale

RUDOLPH FE 7-D is a state-of-the-art ellipsometer from RUDOLPH Research Analytical. This versatile device is capable of performing a wide range of spectroscopic measurements related to thin-film measurement, optical film properties, and doping studies. RUDOLPH FE 7D delivers superior accuracy, precision, and repeatability that meet the toughest requirements for use in process control and research applications. FE-7 D is designed to measure thin-film optical characteristics such as refractive index, thickness, structure, and chemical composition. It uses the ellipsometry technique, which is based on the measurement of the polarization state change of a light beam after it is transmitted through a thin film. This method offers unequalled accuracy, speed, and sensitivity. With its wide range of features, users can make a large variety of optical measurements quickly and accurately. FE 7-D includes a variety of measurement capabilities. The multi-angle sample stage enables the user to measure thin films with high accuracy over a large range of incident angles. FE 7D also features a high-resolution CCD detector that allows spectroscopic measurements in the ultraviolet, visible, and near-infrared regions with the high throughput. In addition, the device is equipped with advanced software that allows analysis, visualization, and reporting of the data. The software's user-friendly graphical interface makes it easy to navigate and navigate. RUDOLPH FE-7 D has a wide range of applications. It can be used to characterize thin films, such as coatings, dielectrics, and metals used in semiconductor and nano-structures. It is also used to measure the optical constants of a substrate, such as refractive index, extinction coefficient, and optical anisotropy. Additionally, RUDOLPH FE 7-D is capable of studying the chemical components of a sample, such as dopants and impurities, as well as its physical properties, such as strain and texture. Overall, RUDOLPH FE 7D is a powerful, highly advanced ellipsometer that is capable of performing a wide range of spectroscopic measurements with superior accuracy, precision, and repeatability. This versatile device offers a user-friendly graphical interface and multiple measurement capabilities, making it ideal for both process control and research applications.