Used RUDOLPH FE 7 #9147691 for sale

RUDOLPH FE 7 is an optical ellipsometer capable of polarimetric spectroscopic ellipsometry. It is powered by a Xenon-arc lamp and features a variable angle sample holder which allows for separate measurement of s- and p-polarized light from 0° to 70° incident angle. The instrument is equipped with a 12 bit CCD detector and can measure 16 wavelengths simultaneously. Its Lambda Advanced software provides the ability to characterise thin films from 2nm to 20μm from the UV-Vis-NIR range of 290nm - 1700nm. RUDOLPH FE-7 provides precision measurements for a wide range of applications such as: Reflectivity and transmittance analysis of multilayer samples such as semiconductor films, coatings, and dichroic materials. Phase shift and absorption information for thin films. Measurements of both homogeneous and inhomogeneous samples. Analysis and characterization of buried interfaces, rough surfaces, smooth surfaces, and thin films. Refractive index and thickness measurements for samples up to 50 μm in thickness. The combination of a 20 step motorized stage, a CCD detector, and calibrated filters makes FE 7 an excellent research tool with the highest polarimetric accuracy in the market. Ease of use is also one of the major features with an intuitive graphical user interface (GUI). The intuitive GUI allows the user to quickly configure their measurement settings, calibrate the system, and collect data. Additionally, the automatic optimization feature minimizes the time spent on setups and measurements, while the scripting feature simplifies ongoing experiments and experiments with large sample sets. Finally, FE-7 offers reliable results with repeatable measurements. It also has an adjustable laser spot size that is ideal for small samples, such as semiconductor substrates. With these features, RUDOLPH FE 7 is an ideal instrument for the analysis of polarized light and thin film characterization.