Used RUDOLPH FE 7 #9208162 for sale

RUDOLPH FE 7 is a high-performance, high-precision ellipsometer used for measuring the optical properties of thin films and surfaces. Ellipsometers measure the amount of light reflected from and transmitted through a sample and determine an angle of polarization. This value can be used to evaluate the optical properties of films and surfaces. RUDOLPH FE-7 is a combination of a polarized light source and high-sensitivity polarimetry system. The light source is a stabilized xenon arc for broadband illumination with a spectral range from 175 to 3300 nanometers. This illumination yields an excellent signal-to-noise ratio and precise, stable operation. The polarimetry unit is an automated Nicoll-type polarimeter with a dual-transforming-ratio analysis algorithm. The use of a near-normally incident angle with this polarimeter yields ultra-precise ellipsometric data with ultra-high accuracy. The intuitive user interface is designed for ease of operation and offers real-time monitoring of polarization conditions. Measurement parameters can be adjusted to various settings as needed. Furthermore, the instrument offers several modes of operation, including angle-scan, angle-slope, and profile- scan modes. These modes allow users to capture a wealth of data from a sample. FE 7 has advanced data collection, analysis, and reporting features for completed measurements. The instrument is equipped with both a built-in data storage and built-in printer, meaning results are always at your fingertips. Results are easily exported to a spreadsheet or other analysis software for further study. User-friendly applications are available to sychronize data from multiple instruments in real-time. Finally, FE-7 is designed with an advanced self-diagnostic system to ensure error-free measurements. In sum, RUDOLPH FE 7 is an excellent solution for accurate and reliable thin-film and surface measurements. Its intuitive design allows users to easily operate the instrument and its advanced features and data collection capabilities enable a thorough study of samples.