Used RUDOLPH FE III #293655511 for sale

RUDOLPH FE III is an ellipsometer designed for use in thin film characterization and rocking curve analysis tasks. It is equipped with a step motor-driven RUDOLPH FE Nomarski interferometer, and is capable of accurately measuring extremely thin films on a variety of materials. The ellipsometer's circumferentially-moved linear incoherent bright-field illumination source allows measurements from 4-85° incidence angle with a 20-100 μm spot size. These measurements provide information about films' thickness, optical anisotropy, and other parameters. RUDOLPH FEIII equipment's components include an optical head, a PC with a touch-screen monitor, a sample rotation unit, a power supply, a remote vacuum system, and a sample stage. The optical head provides the angle-measuring, image-forming, and display functions, and accepts a variety of interchangeable accessories. Its optics uses monochromatic light from a helium neon laser with a wavelength of 0.6328 μm and includes a beam splitter, an objective lens, a photodetector, and several other optical components. The PC is capable of controlling the optical head, as well as storing measurement data. It also allows for remote operation via a web browser interface, making it suitable for field applications and remote operation from another PC or tablet. The integrated Zenith ProcessingⓇ software provides live film characterization from a single measurement as well as high resolution rocking curves with the great data quality expected from this model. The sample rotation unit can rotate samples at up to 40 000 rotations per minute, which is necessary for acquiring rocking curves with high spectral resolution. The remote vacuum unit is used for low-energy sample preparation and is also equipped with a LED microscope, which can be used as an alignment machine. FE-III is also equipped with a precision stepper-motor and ball-screw for moving the sample stage over a range of up to 100 μm. This allows for precise analysis of samples with multiple layers. Additionally, sample temperature, pressure, and humidity can be controlled for accurate characterization. Overall, FEIII is an advanced and reliable ellipsometer well-suited for measuring thin film parameters. Its advanced optics, precision sample stage, and easy-to-use software make it ideal for a variety of sample analysis tasks.