Used RUDOLPH FE III #293752178 for sale

RUDOLPH FE III is an ellipsometer designed and manufactured by RUDOLPH Research Analytical and used in the characterization of thin film materials. It works by measuring reflection and transmission of polarized light. The unit is fitted with a polarizer, phase retarder, detector head and goniometer which each help determine the thickness and optical properties of the thin film, such as its refractive index, extinction coefficient, and optical constants. RUDOLPH FEIII is designed to measure ultrathin (only 1-2 nm thick) films, including polymers, semiconductor nanostructures, metals, and dielectrics. It also has an optional ultraviolet attachment, allowing for the characterization of ultra-thin films in the UV range. The unit is computer-controlled, with a user-friendly interface and data analysis software for easy operation. FE-III has an elliptically-polarized white light source that illuminates the sample and a 3-axis goniometer that measures the sample's reflected or transmitted light. The unit is fitted with a rotating polarizer which selects the reflected light from different angles and sends it to the detector which measures the intensity of the light and its polarization state. The detector head consists of an aperture wheel, a rotating phase retarder, and an analyzer wheel. Together they measure the ultra-thin film's optical constants such as the refractive index, extinction coefficient, and absorption coefficient. The unit also has an automated sample-changer option which allows for the characterization of multiple samples in one run. This feature ensures that a high level of accuracy is maintained; due to the small thicknesses involved, small variations in the sample positioning can affect the measurements. The user-friendly interface and data analysis software allows the user to easily collect and analyze measurements. RUDOLPH FE-III is an industry standard for characterizing extremely thin film materials with precision and accuracy, making it an ideal choice for universities and research institutions. Easy operation, reliable results, and high levels of accuracy make this ellipsometer a superb choice for thin film characterization.