Used RUDOLPH FE III #9100481 for sale

RUDOLPH FE III is an ellipsometer, a device typically used to measure the optical properties of thin films and substrates. This advanced tool is capable of measuring the optical characteristics of thin films with nanometric accuracy, and is widely-utilised in a broad range of scientific applications, including optics, electronics, material science, and biology. The basic operation of RUDOLPH FEIII is the measurement of the optical properties of a thin film through the use of the phenomenon of ellipsometry. This is an optical method whereby polarized light is incident on an object and the properties of the reflected light are measured. The changes in the polarization angle and intensity of the reflected light are then used to calculate the optical constants of the sample. FE-III has high-performance features which allow for the accurate measurement of thin film properties. These features include a high-resolution polarimeter, an MTECA CCD detector, a specifically designed optical path and an intuitive user-interface. FEIII further includes two integration chambers, an optical path stability control system, and a long-wavelength system that allows for measurement of films over the 450-1000nm range. RUDOLPH FE-III is capable of a broad range of ellipsometry applications. The measuring capabilities of the device include the determination of thickness and optical constants of thin films, in addition to analysis of refractive indices in single-layer, multi-layer, and multiple-layer surfaces. FE III also has the capacity to capture, analyse and visualize in real-time, allowing for reliable data acquisition and reporting. In short, RUDOLPH FE III is an advanced ellipsometer allowing for the determination of optical properties of thin films and substrates with high accuracy. Its long-wavelength range, intuitive user-interface, and high-performance features make it an indispensible tool for scientific and industrial applications.