Used RUDOLPH FE III #9139660 for sale

RUDOLP RUDOLPH FE III is an advanced spectroscopic ellipsometer that is used to measure the thickness, composition and optical properties of materials. It is primarily used to measure the optical characteristics of thin films on substrates and surfaces and can detect even the smallest layer thicknesses down to the nanometer range. The RUDOLPFE III consists of a diverse selection of interchangeable reception modules, working in a wide range of wavelengths from the UV to the IR region. It is operated by a simple-to-use graphical user interface that displays and records data clearly and accurately. The device feature a robust construction and reliable performance, with a computer-controlled optical system that utilizes a rotating compensator to measure the polarizarion of a sample's reflection. It is capable of continuous scan-mode operation to understand both the in-plane and out-of-plane parameters of a sample. RUDOLPH FEIII is equipped with a range of specialized software tools designed to further improve its accuracy and performance. The software provides an intuitive interface for the configuration of the instrument, setting up of parameter scans and interpretation of measurement data. It can also be used to calculate the optical constants and optical properties of layered samples. FE-III comes with a unique accessory kit that includes a high-end reference cell for absolute measurements, polarization optical elements, 4-element long-pass filter and a spectrometer module. These accessories further enhance the device's accuracy and performance. In addition, the instrument also features an integrated motorized rotator as well as an additional range of optical components for wide-angle ellipsometry. This system allows for the use of highly reliable measurements and an extremely wide range of analytical capabilities. To sum up, the RUDOLP FEIII is a state-of-the-art spectroscopic ellipsometer that offers fast, precise and reliable measurement data and can detect even the smallest layer thicknesses down to the nanometer range. The flexible design and accurate software features make the instrument ideal for many applications across different industries.