Used RUDOLPH FE III #9165607 for sale

RUDOLPH FE III is a research grade spectroscopic ellipsometer designed to measure the optical properties of materials with extremely high accuracy. This tool is used in a wide array of experiments, including reflective and transmissive coating measurements, semiconductor device structures, optical material characterization and more. RUDOLPH FEIII is fitted with a Peltier-cooled CCD imaging camera, and uses the principles of Ellipsometry to provide measurements of the optical properties of surfaces with negligible backlash, drift and hysteresis. FE-III also provides superior dynamic range and accuracy compared to other ellipsometers in its class. FE III has a 256 channel wavelength range (from 200-1200nm) with a resolution of up to 5nm, allowing users to accurately measure the optical properties of materials. The system features a computerized sample table for sample positioning and a motorized polarimeter for taking alignment measurements. RUDOLPH FE-III has a mobility software package that it is integrated with, allowing users to connect the ellipsometer to either a PC or network-ready PC. FEIII's polarimeter has a wide measurement range up to +/- 180° and a large range for multiple sample positions. The system also includes a software component that allows for external automated control of parameters and advanced measurements. This also allows for cross-polarization, divergence compensation, photoelasticity, and multi-angle measurements. RUDOLPH FE III is a highly accurate and reliable tool. The closed-loop calibration ensures accuracy and stability throughout the entire measurement process, allowing for precise and reproducible measurements. The system also features exceptional stability and low noise levels, allowing users to measure even the most minute changes in optical properties. RUDOLPH FEIII is a superior instrument for optical materials characterization, and combines the ergonomic features of a standard ellipsometer with the technical sophistication of an advanced ellipsometer. Its superior performance, user friendly features and advanced software capabilities make it a reliable and powerful tool for optical characterization and research.