Used RUDOLPH FE III #9187409 for sale

RUDOLPH FE III is a compact, full-featured Ellipsometer with high precision and cold light reflectometry. It is specifically designed for research and development in thin film and surface characterization. The equipment utilizes a simple, user-friendly software interface to configure all measurement parameters and processes a wide variety of samples. RUDOLPH FEIII Ellipsometer consists of an illumination source, an optical system, a user interface, and analysis software. The illumination source is an almost incoherent light source with a slit providing a continuous wavelength. The optical unit includes a white or monochromatic light source, a polarizing prism, a compensator, a measuring element, and an optical receiver. The optical receiver consists of a CCD camera at the rear of a microscope objective. The optical machine is designed to measure the extraordinary and ordinary optical constants of thin films and surfaces. The user interface is simple and intuitive. It allows for precise adjustment of the sample angles and other parameters. Data can be stored for further analysis and graphing of the data. The software included with FE-III Ellipsometer provides calculations of physical parameters such as refractive indices, extinction coefficients, optical constants, and thickness of materials. It also offers advanced features such as multiple-measurement point analysis, spectral measurements, dispersion measurements, and angular variations to capture polarization dependences. The main benefits of RUDOLPH FE-III Ellipsometer are its fast and accurate measurements single-beam configuration, and software usability. The tool is ideal for characterization of surface and thin film properties for industrial and research-oriented applications. It will provide users with all of the tools they need to perform precise measurements of optical properties and accurately characterize their sample's properties.