Used RUDOLPH FE III #9191653 for sale

RUDOLPH FE III is a state-of-the-art optical ellipsometer that provides a comprehensive characterization of materials from the microscopic to the macroscopic level. It is an indispensable instrument for materials science researchers involved in studying optical properties of a wide array of materials, from polymers films and oxides to metals and semiconductors. RUDOLPH FEIII uses the principle of ellipsometry, which involves measuring the properties of light that has been reflected off a sample surface. By careful monitoring of the changes in light polarization, it is possible to accurately measure a wide range of optical properties for a sample. This includes both the refractive index and the extinction coefficient. FE-III provides a comprehensive characterization of the surface and interfaces present on a sample. This makes it especially useful for many types of characterization work, such as that of thin films, multilayer structures, and composite materials. It can also be used to determine thicknesses of dielectric films, or measure the optical properties of a material as a function of wavelength. FEIII is capable of measuring both the amplitude and phase of the reflected light beam. This allows for a more accurate determination of optical properties than is possible with conventional ellipsometers. In addition, the measurements that are generated by RUDOLPH FE-III can be acquired over a wide range of angles, providing the user with a wide range of measurement options. FE III is a versatile instrument, with a wide range of possible applications. It is well suited for characterizing materials and devices in research and development settings, and has even been used in production facilities to ensure that high standards are consistently maintained. In conclusion, RUDOLPH FE III is an advanced optical ellipsometer that provides accurate measurements of materials properties at the microscopic and macroscopic levels. It is an invaluable analytical tool for materials science research, making it possible to characterize a variety of materials and devices with a high degree of precision.