Used RUDOLPH FE III #9196404 for sale

RUDOLPH FE III is a state-of-the-art, automated ellipsometer for advanced materials characterization. The ellipsometer includes two adjustable antennas, enabling the measurement of multiple polarization states in a single scan. These antennas allow the equipment to measure the amount of light reflected from a sample and the angle of polarization change that occurs due to the interaction between the light and the sample's structure. This provides a direct visualization in real time of the sample's overall optical performance. RUDOLPH FEIII also makes use of non-contact measuring head and a FUV/IR optics design which allows users to obtain highly accurate results with little time and effort. With this device, users are able to obtain accurate, repeatable measurements of optical parameters such as the refractive index, retardation, thickness and film composition with a lateral resolution of nanometers. It is also capable of performing over-layer characterization, allowing analysis of multilayer structures with great detail. The user-friendly software interface included with FE-III provides an intuitive way to set up and perform experiments. The software also includes several add-ons which allow for the analysis of specific materials, or for the enhancement of the data obtained from the ellipsometer. RUDOLPH FE-III is a highly reliable system that provides precise and accurate measurements that are essential for a wide range of applications, such as biological, optoelectronic testing, optical coatings, and for research in the fields of photonics, nanotechnology and semiconductor devices. The unit includes several integrated safety systems, ensuring that all measurements are accurate, reproducible, and non-destructive. It is also equipped with a built-in temperature control machine and carries an ISO certification, making it ideal for working in industrial settings as well. FEIII is an automated tool that has pushed the boundaries of materials characterization and is an invaluable tool for research, development and industrial applications. It is well-suited for many industrial and research needs, and is the perfect choice for anyone looking for a fast, reliable and accurate asset for materials characterization.