Used RUDOLPH FE IIID #293604305 for sale

A RUDOLPH FE IIID Ellipsometer is a highly advanced optical metrology device that uses the principles of polarization and ellipsometry to measure the optical properties of surfaces. It measures the thickness of thin films and surface parameters, as well as provides feedback on the physical characteristics of thin films on a wide variety of substrates. RUDOLPH FE-IIID Ellipsometer is designed with a variety of features and capabilities, making it an ideal choice for demanding optical measurements. FE III D Ellipsometer uses a fixed and variable angle geometry, which provides accurate measurements and reliable characterization of thin film properties. This state-of-the-art technology allows for both in-line and lab measurements, eliminating the need to manually change the angle of incidence. Its variable angle range of 30-85° enables measurements of thin films with variable angle of incidence on the same sample. In addition, FE IIID Ellipsometer boasts a highly sensitive polarized detector. This unique feature allows for the acquisition of angular dependent ellipsometric parameters (i.e. amplitude, phase). The detector also exhibits superior wavelength resolution and detection accuracy, making it ideal for measurement of thin films and surfaces properties. FE-IIID Ellipsometer comes with SEAR software for a straightforward user experience. SEAR is a user-friendly interface that includes a complete range of analysis functions such as layer modeling (modeling thin films on top of a substrate), stack modeling (modeling of complex stacks of thin films), and graphing of measured parameters. The software is an intuitive platform that allows for easy measurement setup and offers comprehensive data analysis capabilities. RUDOLPH FE III D Ellipsometer also features several hardware functionalities designed for advanced ellipsometry applications. It is equipped with a remotely controlled motor that facilitates the rotation of the compensated High Speed Liquid Crystal (HSLC) detector. This makes possible the angle dependent measurements providing information about the sample's angular dependence. Furthermore, the device is equipped with a mechanized sample stage for convenience and ease of sample positioning. It also comes with a simplified sample changeout to further expedite sample changes. RUDOLPH FE III/D Ellipsometer is an excellent choice for precision optical metrology. Its powerful features make it an ideal device for applications involving thin film characterization and optical property measurement. With the user-friendly SEAR software, advanced technology, and its many functionalities, FE III/D Ellipsometer provides reliable, accurate measurements and characterization of thin films and surfaces.