Used RUDOLPH FE IIID #293660842 for sale

RUDOLPH FE IIID is an advanced ellipsometric spectrometer that is used to measure optical parameters such as the refractive index and thickness of thin films and interfaces. This instrument is an automatic, easy to operate, robust platform that allows users to measure a wide range of materials such as semiconductors, dielectrics, polymers and combination films. RUDOLPH FE-IIID system combines a powerful 1.5 mW HeNe laser, sophisticated software control and feedback and an inverted optical head which allows samples of unrestricted height to be analyzed. The system is composed of an inverted optical head, which is not only capable of unrestricted height samples, but also allows ellipsometer measurements down to a few nanometers in thickness. The optical head has a motorized polarizer, compensator, and sample axis which allow precise rotational adjustments from -90° to +90°. A CCD detector design is also provided which offers rapid data acquisition times and uniform spectral responses from 250nm to 950nm. The HeNe laser, operated at 632.8nm, is highly stable and has excellent beam mode filtering. This stability allows for more accurate measurements over a wide range of angles. The laser also allows for high-reflection measurementsmaking it suitable for use with reflectance spectroscopy and other techniques such as Mueller matrix applications. FE III D includes an adjustable light source which makes it suitable for thin film characterization with polarizer permittivity and reflection/transmission spectra. The spectra can be obtained with the polarized light spectroscopy and the spectra can be compared to the spectra of the sample. Additionally, RUDOLPH FE III/D can measure interference color, Transmission/Reflection coefficients, and the azimuthal and polar variance of a sample. The intuitive software is designed for ease of use and allows users to enter pertinent data such as sample name, thickness, and refractive index. It also provides data analysis and various modeling capabilities. Users can export data in multiple formats for further analysis or sharing with colleagues. FE III/D is a reliable and powerful spectrometer with its flexible optical head design, adjustable light source, HeNe laser stability, and powerful software control. This makes FE IIID an ideal choice for ellipsometer applications requiring highly accurate data and quick measurements over a wide range of materials.