Used RUDOLPH FE IIID #9139658 for sale

RUDOLPH FE IIID is an ellipsometer used to measure the physical thickness and optical properties of thin films. It works by shining polarized light on a sample and then measuring the resulting intensity and polarization changes. The resulting data can be used to determine the thickness and optical constants (refractive indices and absorption coefficients) of thin film materials. RUDOLPH FE-IIID utilizes a CCD camera with seven highly sensitive optical filter bands ranging from 350 to 2800 nanometers in order to accurately measure and analyze sample surfaces. By combining the angular information measured by the CCD camera with the intensity data provided by a visible helium-neon laser, FE III D can obtain measurements at several points up to a half millimeter apart. In addition to being a useful tool for internal research, FE-IIID is capable of obtaining reliable data for quality control purposes. For example, manufacturers of semiconductors often need to measure the precise thickness of thin films for product control purposes. Data generated by FE III/D is highly reliable when it comes to measuring thin film deposits and their associated optical constants. Due to its extreme accuracy and durability, RUDOLPH FE III D has become a frequent choice for laboratories and production facilities that require fast, accurate, and reliable measurements of thin film materials. owing to its advanced data acquisition and analysis system, RUDOLPH FE III/D is able to provide researchers with the exact results they need. FE IIID is a flexible, easy-to-use, and reliable system for obtaining precision measurements of thin film samples. Its high accuracy and repeatability make it the perfect tool for deriving comprehensive information related to thin film materials. This information is invaluable for quality control and research purposes.