Used RUDOLPH FE IIID #9296247 for sale

RUDOLPH FE IIID is an advanced spectroscopic ellipsometer designed to measure thin films and perform automated characterizations of materials. It operates on the principle of ellipsometry, where light is used to determine the physical properties of a material, most often thickness and refractive indices. RUDOLPH FE-IIID is equipped with a HeNe laser, capable of delivering light with a wavelength of 633nm, and can measure a wide range of thicknesses, from several nanometers up to several hundred nanometers. The ellipsometer is composed of optical components, such as polarizers, beamsplitters, and compensators, that use polarized light from the laser source to accurately measure the optical properties of a thin film or coating. The instrument consists of several divisions, which include the sample stage, ellipsometer head, and control section. The sample stage is used to hold and position the thin film, while the ellipsometer head consists of a series of optics and accessories that accurately measure the thin film properties. The control section houses the power and communications boards, which allow the user to control the settings and adjust the parameters of the instrument. FE III D provides a range of powerful features, making it capable of measuring components and materials with high precision and accuracy. It has highly-sensitive optical components, as well as a wide measurement range that enables automated characterizations of materials. The instrument is equipped with a remote control feature that allows the user to adjust settings and modify the parameters without having to come in contact with the instrument. Additionally, the unit can measure both sides of a sample simultaneously, providing a single set of measurements. All measurements taken with FE-IIID are considered highly accurate and reliable, making it ideal for laboratories looking for precise, repeatable results. Powerful software is included with the unit, allowing for easy data analysis and storage. The instrument is also compatible with most microscope systems, making it perfect for examining and characterizing extremely thin films and small structures. In conclusion, FE III/D is an advanced Spectroscopic Ellipsometer that delivers highly accurate and reliable measurements of thin films and coatings. Equipped with a range of powerful features, automated characterizations, and a remote control, this instrument is ideal for laboratories looking for highly precise scientific measurements.