Used RUDOLPH FE IV D #66743 for sale

RUDOLPH FE IV D is an advanced autocollimation holographic ellipsometer which provides reliable measurements of optical properties of thin films and optical materials. It employs proprietary high-speed, low-noise holographic optical elements with superior self-alignment, and phase modulation techniques to produce reliable and repeatable results. RUDOLPH FE IVD utilizes an integrated two-point, two-wavelength ellipsometer that provides the most accurate and repeatable optical property measurement with the greatest sensitivity. The two-point, two-wavelength ellipsometry can detect even the smallest changes in film thickness or film optical constants over time and is ideal for precision measurement of optical properties of thin films and other optical materials. The autocollimation capability of FE-IVD not only reduces the complexity of the instrument's setup, but it also minimizes the amount of required sample preparation. The holographic optical elements and precision motors help ensure the highest performance of the instrument. Additionally, FE IV D's simple, easy-to-use graphical user interface makes it a user friendly instrument. RUDOLPH FE-IVD has several features which enhance its ability to accurately measure optical properties of thin films and other optical materials, such as its unwavering interferometric head unit, auto-calibrating power compensator, high-resolution reticle detector, auto-center focus, Dual Beam Autocollimation system and its ultra-high-resolution stereo video monitor. The instrument also has a variety of automatic and manual functions, giving the user complete control over the test parameters. FE IVD has been designed to be used in many markets, from the analytical and research laboratories to industrial production and industrial automation. RUDOLPH FE IV D is robust and reliable enough to be used in even the harshest environments. Its flexible design enables it to be easily customized to meet the needs of various applications. RUDOLPH FE IVD is a highly reliable and efficient tool for accurately measuring optical properties of thin films and optical materials. Its powerful features ensure the highest accuracy and repeatability, while its simple graphical user interface and automatic and manual functions make it a user friendly and powerful instrument.