Used RUDOLPH FE IV D #9375034 for sale

RUDOLPH FE IV D is an ellipsometer designed by RUDOLPH Research Analytical for a wide variety of production and research applications. RUDOLPH FE IVD is a multi-wavelength, mapping ellipsometer capable of collecting full Jones matrix data in a non-contact, non-destructive manner over the entire surface of a sample. This equipment is highly configurable for UV-Vis-NIR spectroscopy applications, enabling users to quickly and easily measure optical constants, film thickness, refractive index, and other film properties. FE-IVD is based on rotating compensator technology, utilizing a unique sample scanning component which controls the scanning angle and the optical accessory attachments. This control allows for rapid analysis of different sample types, while maintaining utmost accuracy when collecting data. The optic cart is equipped with several interchangeable Polarisators and compensators which dramatically extend the measurement capabilities and range of angles of incidence that can be analyzed. High precision digital encoders monitor the angular distance traveled and enable the system to rapidly transfer data between pixels. FE IV D is designed for both routine production control and investigative research. The unit's integrated software is intuitive and easy to use, allowing users to quickly set up experiments for a variety of applications. Additionally, RUDOLPH FE-IVD is equipped with a graphical user interface (GUI) that simplifies data analysis. This visual interface allows for straightforward editing of parameters and data views, allowing users to quickly diagnose data and focus on relevant results. Additionally, FE IVD integrates a comprehensive library of prior measurements to allow for easy comparison and diagnostics. RUDOLPH FE IV D is an excellent choice for establishing process control on production lines due to its repeatable and reliable performance. Its optical assembly is robust and features up to 12 alpha points of automated scanning. Additionally, RUDOLPH FE IVD supports a wide variety of environmental sensing and control to ensure that repeatable measurement conditions are achieved. FE-IVD is truly a versatile machine, suitable for use with a wide variety of substrates. With its excellent performance, multi-faceted design, and simple yet powerful software interface, FE IV D is an ideal ellipsometer for production environments, as well as research applications. The design of RUDOLPH FE-IVD allows users to quickly and accurately measure optical constants, film thickness and refractive index of a variety of sample types in a non-contact, non-destructive manner.