Used RUDOLPH FE IV #293758797 for sale

RUDOLPH FE IV is an advanced ellipsometer designed and manufactured by RUDOLPH Research Analytical. The advanced optical metrology equipment was specifically designed to measure thin film optical properties of semiconductor and advanced nanomaterials. RUDOLPH FE-IV is a highly configurable system that is capable of measuring the thickness, optical constants and refractive indices of both thin and thick films. The unit is equipped with a variety of polarized and unpolarized beams, that are used in combination with a rotation stage to measure both linear and circular bi-directional reflectance data from the same sample. The machine is designed to be accurate, reliable and offer repeatable results in multiple configurations. For example, the tool can be configured to measure absolute thickness, optical constants and refractive indices of a sample without the need for reference samples and is highly adaptable to a variety of materials due to its superior optics. FE IV is both user friendly and easy to operate. The software is intuitive and offers a variety of customizable settings that can be easily adjusted to fit the requirements of different applications. The asset also features a large range of wavelength accessories and special optical components that can be customized for specific applications. FE-IV also offers high speed data collection, with a high data rate ensuring that measurement times are kept to a minimum. Additionally, the model includes a range of advanced features such as automated scan and navigate capabilities and real-time images, allowing for complete control and real-time analysis. Overall, RUDOLPH FE IV offers an advanced and reliable measurement tool that is capable of providing highly accurate results. It is suitable for a range of applications in the semiconductor and nanomaterial fields, and its intuitive software and various customization settings make it ideal for a variety of high precision experiments.