Used RUDOLPH FE IV #9083743 for sale

RUDOLPH FE IV is an advanced ellipsometer designed to measure thin film properties through optical interference with high accuracy. The ellipsometer utilizes a 4-wavelength monochromatic illumination and non-contact measuring method which can precisely measure various materials including metals, oxides, polymer film, and nanomaterials. Additionally, the device is capable of measuring thin films in the range of 1 - 1000 nm with an accuracy of 0.01°. RUDOLPH FE-IV utilizes a low-vacuum chamber to reduce air turbulence and ensure highly accurate measurements of surface films. The accuracy of the ellipsometer is further improved through its high-order retardance measurement capability, which allows for more precise measurement of thinner films. The device is equipped with two polarized lasers and a white light source and have the ability to measure angle of incidence up to 70° with a resolution of 0.001° in the near-infrared, visible, and ultraviolet regions. FE IV also has a large sample size capability, allowing it to measure up to 3 cm² of sample area and a variety of sample shapes, such as 2D and 3D surfaces. Furthermore, the device is designed to collect data on coating thickness, refractive index, optical anisotropy, and film birefringence, enabling users to analyze complex optical surface and thin film systems. FE-IV has robust software and hardware capabilities to accommodate a wide range of research needs. For example, it has a remote control with cross-platform compatibility, giving users the ability to run measurements from multiple platforms, such as PCs, Macs, and tablets. Additionally, the ellipsometer's intuitive and easy-to-use software provides users with various data analysis and visualization tools. Overall, RUDOLPH FE IV is a technologically advanced ellipsometer that provides highly accurate and reliable measurements of thin film properties in a variety of materials. Its easy-to-use software and wide range of capabilities make it a valuable tool for a variety of research applications.