Used RUDOLPH FE IV #9097166 for sale

RUDOLPH FE IV
Manufacturer
RUDOLPH
Model
FE IV
ID: 9097166
Wafer Size: 8"
Vintage: 1995
Film Thickness Measurement System, 8", 1995 vintage.
RUDOLPH FE IV is an advanced ellipsometer designed to measure optical properties of thin films and surfaces. It is used for characterization of optical materials such as lenses, windows, and coatings. It consists of a monochromatic light source, a sample mount, an ellipsometer head, a controller unit, and a personal computer. The light source is a monochromator that uses a single wavelength of light so the intensity of the light transmitted through the sample can be controlled and measured. The light source is connected to the ellipsometer head, which measures the change in the polarization of the light beam as it passes through the sample. The controller unit is used to adjust the sample mount and the beam path to enable measurement of the optical properties of the sample. The polarizing conditions for the ellipsometer are set on the controller which is responsible for detecting the angle of reflected or transmitted light. The rotation angle and ellipticity of the beam are then compared to calculate the optical constants of the sample. The personal computer is used to store and display the data received from the controller unit. RUDOLPH FE-IV also allows the user to save the data in various formats so that it can be used for further analysis. In conclusion, FE IV is a state-of-the-art ellipsometer that provides reliable and accurate optical measurements of thin films and surfaces. It is ideal for scientific and industrial applications where the optical constants of materials need to be determined.
There are no reviews yet