Used RUDOLPH FE IV #9144800 for sale

RUDOLPH FE IV is an ellipsometer which is used to measure the optical properties of materials. The equipment is made up of a light source, a polarizer, a sample stage to position the sample, and a detector. The light source emits a linearly polarized beam which is then passed through the polarizer where the polarization angles can be adjusted. The beam then passes through the sample and the detector measures the polarization angle changes. The results of the measurements are used to determine the optical properties such as the birefringence and the refractive indices of a sample. RUDOLPH FE-IV system is an advanced ellipsometer which offers automated sample positioning, an optimized polarizer, a laser source, and real-time data analysis. The laser source provides a high precision, low divergence linearly polarized beam of light which ensures accurate results. The motorized sample stage can be adjusted for both polar and azimuthal angle measurements. The optimized polarizer enhances the linearity of the optical signal and ensures improved repeatability of results. The real-time data analysis enables fast and accurate measurements with little or no need for post-measurement data processing. FE IV is ideal for research applications such as thin film characterization, optical thin film development, and production line testing. The unit is also suitable for advanced fabrication methods such as OLEDs, liquid crystals, and microfluidics. The machine is compatible with a variety of Windows-based software packages that allow for further data analysis and graphical representation of results. The tool can also be used for calibration and adjustment of lenses, prisms, and mirrors that are used in imaging systems. In addition to its versatile ellipsometry applications, FE-IV asset also provides a thermal wave imaging function. This feature utilizes the energy from the laser in order to create a thermal wave, which is then analyzed to obtain information about the sample temperature. This is a valuable feature for materials scientists who study the properties of materials which can change with different temperatures. Overall, RUDOLPH FE IV model is a robust and reliable ellipsometer that provides accurate results and fast data analysis for a variety of materials characterization tasks. Its versatile features and advanced capabilities make it an ideal choice for research, development, and production line applications.