Used RUDOLPH FE IV #9161279 for sale

RUDOLPH FE IV
Manufacturer
RUDOLPH
Model
FE IV
ID: 9161279
Ellipsometer.
RUDOLPH FE IV is an advanced ellipsometer, used for measuring thin film thickness. It operates by making use of the fact that light reflected off a film changes its polarization when passing through a medium of varying thickness. In a RUDOLPH FE-IV ellipsometer, a light source emits a beam through a polarizer, and onto a sample. The light is then reflected back towards a second polarizer, which is used to measure the effects of polarization caused by the film it has passed through. Through a combination of this information and data acquired from an array of detectors, it is possible to accurately measure the thickness of the film. FE IV is the latest offering from RUDOLPH Technologies, and is one of the most advanced and accurate ellipsometers available. Its proprietary Polarized SmartIps technology is able to detect andcorrect any errors that may occur, ensuring unparalleled accuracy in measurements. It can measure thin films up to 8 nanometers in thickness, as well as those up to 4,000 nanometers. FE-IV utilizes a color Graphic User Interface (GUI) that is able to accurately display laboratory-quality graphs, helping to provide detailed results that are easily interpreted. When compared to other ellipsometers, RUDOLPH FE IV stands out due to its sheer accuracy. Its advanced Polarized SmartIps technology is able to detect errors on the nano-scale, ensuring that the measurements are extremely precise. In addition, its user-friendly GUI makes it easy to control and utilize the machine, so that even novice users can obtain accurate measurements. RUDOLPH FE-IV is also extremely versatile, and can be used for a range of different experiments. Its unique design allows it to measure the thickness of any film, meaning that it can be used in a variety of applications, whether in the study of optics, or in the development of medical diagnostics. Overall, FE IV is one of the most advanced ellipsometers on the market today. It is capable of extremely precise measurements of nano-thick films, and its user-friendly GUI ensures that it can be used by any user, regardless of their experience. Moreover, it is extremely versatile, and can be used across a variety of experiments, making it a great choice for a range of applications.
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