Used RUDOLPH FE IV #9398259 for sale

RUDOLPH FE IV is an optical ellipsometer that is used for the accurate measurement of the optical properties of thin materials. The device is a 4-wavelength instruments which allows for the determination of coating optical parameters using polarized light. It can measure a wide range of angles of incidence, from 10° to 70°, and is suitable for measurements at near normal as well as off-plane incidence. RUDOLPH FE-IV utilizes an interference filter wheel, multiple photodetectors, and a linear polarizer to measure accurate polarimetric parameters. Its design is improved over the previous FE III Ellipsometer models due to the use of four wavelengths of laser light (633nm, 515nm, 488nm, and 478nm) to measure the sample from multiple angles. These measurements are then used to calculate the optical constants of the sample. The instrument is designed to be bench-top and the output data can be easily analyzed using the Windows based AE Win-EV software. The software features a powerful curve fitting tool to assist the user in extracting the material constants from the data. The instrument also includes an integrated sample plate, allowing simple alignment of samples with the beam axis path. Additionally, the intuitive user interface and graphical display make FE IV an ideal choice for optical coating measurements. The system is also designed with robustness in mind, providing easy maintenance and long-term durability. The advanced design helps to ensure accurate measurements over a broad range of substrates and polar angles. Overall, FE-IV is a versatile ellipsometer designed for researchers looking for a reliable and accurate system for measuring optical constants of thin films and surfaces. It provides the precision needed for research-level investigations and is suitable for use within a laboratory environment.