Used RUDOLPH FE VII D #9097167 for sale

RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected light. The data acquired can then be used to characterize thin films and surfaces, including dielectric constants, layer thickness, and optical anisotropy. RUDOLPH FE VIID features a highly advanced digital signal processor with four synchronized CPU's, allowing simultaneously for ellipsometry measurements in up to 16 frequencies up to the wavelength of 400nm as well as ensuring high precision and repeatability. It has an integrated software package that allows users to easily create analytical functions and acquire reliable and accurate data. It also supports multispectral imaging, allowing users to collect a full matrix of parameters with a single scan. The robust and durable design of FE-VIID includes an aluminum frame, a corrosion-resistant stainless steel plinth, and a specialized table for mounting polarization components. The compact design also allows for easy integration into existing processes and instrument suites. The integration includes a variety of interfaces, such as WLAN and Ethernet, that make remote data collection and storage fast and convenient. RUDOLPH FE-VIID is available with several optional analysis packages, including a dedicated film stress package. This package provides users with a unique combination of ellipsometry measurements, graphical representations, and calculations of stress parameters of thin films. It also includes a stress parameter mapping tool, which is ideal for large-area scanning and characterization. Finally, FE VIID features a soft-start system, which considerably reduces the setup time required to measure samples. Additionally, the highly-accurate sample positioning and adjustment system allows for fast and convenient sample alignment, significantly reducing the time required to make ellipsometric measurements.