Used RUDOLPH FE VII D #9171333 for sale

RUDOLPF RUDOLPH FE VII D is an ellipsometer designed for highly precise measurements of thin film thickness and refractive index. It is a fast and reliable optical tool for optics and thin film measurements. It employs a dual beam optical interferometer and a linear polarizer to measure the ellipsometric angles of reflection for a sample surface. This allows for a more accurate determination of the thickness and refractive index of the films under observation. RUDOLPF RUDOLPH FE VIID is a compact modeling ellipsometer offering excellent accuracy and precision. It is designed to accurately measure as thin as 10nm thick films and is suitable for multi-layer thin film applications such as optical coatings, semiconductor devices and MEMS. It is suitable for research grade, production, or quality control measurements. The equipment of the RUDOLPF FE-VIID consists of four major components: light source, linear polarizer, beam splitter, and detector. The light source is usually a monochromatic HeNe laser, producing continuous polarized laser light. The linear polarizer is used to ensure a linearly polarized beam at the sample. The beam splitter is a dichroic mirrors, which splits the incident beam into two perpendicular components - s and p polarized parts. These two beams are reflected from the sample surface and detected by the detector to measure the sample's optical properties. The RUDOLPF RUDOLPH FE-VIID uses a differential measurement technique to measure the surface's optical properties. The system measures the angle of polarization change of the reflected light, while the intensity of the sample's surface can also be measured using the reflection-transmission technique. The reflection angle information is used to determine the sample's refractive index and thickness. The data generated by the unit is used to characterize the physical properties of thin films. RUDOLPF FE VIID utilizes a graphical user interface (GUI) that enables users to quickly and intuitively set up, control, and analyze measurements. The GUI runs on Windows 7/8 Operating Systems, and is designed for both novice and experienced users. In addition to the GUI, the machine includes a variety of measurement, analysis, and integration modules which facilitate the data acquisition, interpretation, correlation, and modeling of thin film samples. The RUDOLPF FE VII D is an ideal optical analysis tool for research and industrial applications. It is compact and lightweight, making it especially useful for process monitoring and quality control applications. Thanks to superior accuracy and speed, it is well-suited for a variety of sample measurements, enabling researchers and engineers to gain valuable insights into their samples.