Used RUDOLPH FE VII D #9284351 for sale

RUDOLPH FE VII D is an advanced optical elliptical polarimeter designed to measure the optical properties of thin films and layered surfaces with a high degree of accuracy. This instrument is a highly sensitive multi-wavelength spectroscopic platform that uses a circular polarimeter to measure the transmission and reflection properties of thin films and multilayer stacks. Using circular incident polarization, this device also measures optical indices of refraction, extinction coefficient, film thickness, surface roughness, and layer structure. It is equipped with a range of capabilities including the following: A variable angle incident polarizer to measure the film and substrate parameters at a varied wavelength. Spectrally-resolved measurements to determine the optical constants, film and substrate parameters, and interface roughness. Capability to measure complex samples of layered films and interfaces with highly absorption layers. A high resolution, broadband spectrometer to determine the optical and structural properties of film surfaces. A built-in camera for visual inspection of the sample. A programmable LED for illumination of sample surfaces. A scanning laser system for measuring film thickness over a wide range of wavelengths. Specialized software for analyzing and interpreting data such as powerful film fitting and pattern recognition. By utilizing these features, RUDOLPH FE VIID provides users with a fast, precise and reliable evaluation of the optical and structural properties of thin films and interfaces. This instrument can be used to analyze a variety of materials such as metals, oxides, polymers, and semiconductors. Additionally, it offers a low cost, high resolution, and accurate optical characterization of the sample. With its wide range of capabilities and performance, FE-VIID can fulfill a broad spectrum of research requirements and significantly shorten the time required to uncover and identify optical properties of sample surfaces.