Used RUDOLPH FE VII D #9377262 for sale

RUDOLPH FE VII D is a powerful ellipsometer designed to measure the complex optical properties of thin films and surfaces. This advanced technology is used in various industries, such as semiconductor processing, biomedical research, and data storage materials. RUDOLPH FE VIID Ellipsometer combines an ultra-stabilized optical microphone with a vibration-free motorized sample stage. This provides consistent and accurate measurements in temperatures ranging from 0 to 70C. The built-in-temperature control and optical microscope enhance the minimal drift and maximum reproducibility of the ellipsometer. FE-VIID Ellipsometer is ideal for applications that require precision measurements. With adjustable laser intensities and filters, it can measure the angle of incidence, polarization ratio, reflectivity, and other polarization parameters. The generated measurements can be used to characterize physical and optical properties of thin-film materials. FE VII D Ellipsometer offers numerous advantages including power monitoring and in-depth data analysis. Data analysis allows users to identify various materials within a film, as well as recognize any changes in film thickness. The magnetically controlled, precision sample manipulation enables rapid switching of samples from wafer to wafer. The user-friendly surface and versatile software tools make it easy to customize specific experiments. It can be operated fully-automated or manually, and features variable slit size, adjustable sample stage and an illumination system. The RS-232 interface and Ambient Remote Control (ARC) software allow for remote operation. In short, FE VIID Ellipsometer provides highly accurate and precise measurement of optical properties, ideal for a range of applications. Its precision components and customizable software make it an excellent choice for quality assurance and process monitoring.