Used RUDOLPH FE VII #182438 for sale

RUDOLPH FE VII is an Ellipsometer, a device used to measure the optical phenomena of surface film thickness, birefringence, optical constants, and refractive index. It is capable of measuring the changes in light polarization at small angles (down to 0.05 degrees). RUDOLPH FEVII runs on a Lumencor SOLA source, a steady-state light source featuring LED technology. The LED illuminates the sample at an angle of incidence that ranges from 0 to 87degrees. In order to measure the changes in light polarization, a quarter-wave plate and a polarizer are used. The data is collected over the angle of incidence and collected in the form of Mueller matrices. FE-VII is usually used for the characterization of thin film properties and optical properties of transparent samples. It can be used for a range of applications such as measuring the optical properties of liquids, gases, crystals, and coatings. Additionally, RUDOLPH FE-VII is capable of analyzing the layers of nano-scale thin films. The precise measurements can provide in-depth insight into the film structure, composition, and its fluidity. FE VII is extremely versatile, as it can be configured to work in a variety of settings. For example, it can be used in the reflection and transmission modes on a variety of materials, including glass slides and silicon wafers. The samples can be measured in a polar coordinate system, with a range of angles of incidence, from 0 to 87degrees. Additionally, FEVII is also capable of analyzing properties of multi-layer samples with inter-layer refractive index and thickness profiles. RUDOLPH FE VII is equipped with various accessories to maximize the accuracy and precision of the measurements. It utilizes software to provide comprehensive data analysis and data visualization. This software also allows users to quickly obtain the information they need. Furthermore, a special Spectral Ellipsometer is available, which allows the measurement of the spectral response of thin films over a wide range of wavelengths (350nm-1100nm). RUDOLPH FEVII is an essential tool for obtaining fast and accurate thin film measurements. It is extremely versatile, able to measure thin film properties and optical properties of a wide range of samples. It is equipped with several accessories to maximize accuracy and precision. This device provides quick and comprehensive data analysis, allowing users to quickly obtain the data they need. Additionally, its compatibility with a Spectral Ellipsometer offers further measurement capabilities.