Used RUDOLPH FE VII #293647734 for sale

RUDOLPH FE VII is an ellipsometer designed to measure optical parameters, such as the refractive index and optical thickness, of thin films and surfaces. The device is an upgraded version of the highly successful RUDOLPH FE-VI, which has provided reliable and accurate measurements for over 20 years on a multitude of samples. RUDOLPH FEVII has a number of distinctive features: Microprocessor-controlled software ensures accurate data collection The unique Design Mode allows for automatic compensation of tilts and eccentricities from the plane of the sample The Rapid Measurement Mode enables faster measurements and reduces the number of measurements required Two field of view configurations are available: 2.5 mm and 0.5 mm. Wavelength selections are freely accessible in the range from 300 to 800 nanometers The High Selectivity Mode provides for the simultaneous measurement of both linear and circular polarizations, eliminating the need for separate measurments Automated data collection is possible using the optional Data Collection Mode The patented Automated Multiple Measurement Mode is an invaluable tool for measuring multiple samples without needing to set up a new experiment, allowing for much faster data collection The patented Over-Range Measurement Mode is unique to FE-VII, allowing for measurements of samples with optical parameters that exceed the range typically measured by ellipsometers Extended temperature and pressure ranges are available for use with other equipment Data recorded in RUDOLPH FE-VII is easily transferred to a variety of formats for analysis, including ASCII, ISO 16487, and JIS X 0401 The many features combined with advanced software make FEVII a versatile tool for a wide range of materials in the fields of physics, optomechanics, optical engineering, and more. With its extreme accuracy, precise control systems, and extended temperature/pressure ranges, FE VII can accurately measure samples of even complex structures and surfaces, making it an invaluable tool for R&D and sample characterization.