Used RUDOLPH FE VII #9083744 for sale

RUDOLPH FE VII is an advanced high-accuracy and measurement repeatability ellipsometer that provides a powerful tool for measuring thin films and substrate thickness. This ellipsometer is capable of measuring the thickness of films of any material from 1 nanometer to 1 micron, with an accuracy of 0.2 nm. It is designed to measure both optical absorption and transmission of the film thickness over a wide range of wavelengths. This makes it ideal for analyzing the optical properties of thin films. RUDOLPH FEVII Ellipsometer is a multi-functional model that uses state-of-the-art technology to provide accurate thin film measurement results. In addition to providing an accurate measurement of the film thickness, it can also measure its optical performance. This instrument is a reliable tool to examine optical films, optical components, and other components of the optical system, used in the research and development applications. The instrument comes with an intuitive Windows® XP-compatible software, which allows users to easily capture and store film data, to analyze data to calculate the thickness, and to calculate the optical absorption. FE-VII Ellipsometer is able to measure several parameters including optical film thickness, optical absorption, amount of light being transmitted, polarization, reflectivity, and scattering. The experimental results processed can be used in various applications, such as optical device design, material sciences, and semiconductor device research. FEVII has low power consumption and contains its own PC power supply, making it a convenient portable device. The temperature compensation feature enables the user to adjust the step resolution and scan speed without affecting the accuracy of the readings. This highly precise model is also designed with a removable wafer chuck for easy loading, further benefiting research and development applications. FE VII Ellipsometer is a highly reliable yet highly affordable instrument for accurate thin film measurement. The combination of the accuracy, repeatability, and versatility also make it a tool of choice for many optical analysis applications. Additionally, the easy-to-use software provides a simple solution to data storage, processing, and analysis. With its advanced features, this model provides an excellent value to users who need an accurate, efficient instrument for measuring thin films and optical components.