Used RUDOLPH FE VII #9093249 for sale

RUDOLPH FE VII
Manufacturer
RUDOLPH
Model
FE VII
ID: 9093249
Wafer Size: 6"
Film Thickness Measurement Systems, 6".
RUDOLPH FE VII is a top-of-the-line ellipsometer, designed specifically for combined measurement of normal and rotating incidence ellipsometry. It features a four-angle scanning equipment, with angles of inclination ranging from 0° to 89° in 0.1° increments, allowing for accurate, detailed measurements. The system also includes a laser-based normal incident focusing unit to ensure ideal optical conditions, and an automated sample mounting machine for fast, repeatable measurements. The measurements are monitored by a two-channel monitor for maximum accuracy. The monitor measures changes in a sample's ellipsometric properties in real-time, and records the measurement data for further analysis. RUDOLPH FEVII has a number of features to enhance the accuracy and speed of measurements, including a rotating plane polarizer, a linearly polarizing variable rotator, and an automated layer-specific analysis tool to quickly identify and study individual layers in a multi-layer sample. FE-VII also features a highly intuitive software asset and a modular design that can be customized to meet user needs. The software includes built-in features such as multiple data analysis techniques, time-based measurement recording, and rapid data transfer capabilities to quickly analyze and store the data. The modular design also allows for user-specified settings for a custom fit to any measurement scenario, with a plug-and-play versatility that makes changes and upgrades a breeze. FE VII is the ideal instrument for anyone in need of highly accurate and repeatable normal and rotating incidence ellipsometry measurements. It is highly adaptable to any situation, with its wide range of custom software and hardware components, allowing users to customize it to meet their exact requirements. Its combination of accuracy, speed, ease of use, and versatility make FEVII one of the most sought after ellipsometers for any ellipsometric measurements.
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