Used RUDOLPH FE VII #9097170 for sale

RUDOLPH FE VII
Manufacturer
RUDOLPH
Model
FE VII
ID: 9097170
Wafer Size: 6"
Vintage: 2001
System, 6", 2001 vintage.
RUDOLPH FE VII is an advanced ellipsometer which uses spectroscopic techniques to measure the way light reflects off a surface and calculate precise parameters related to optical properties. The instrument combines a UV-visible spectrometer, polarimeter, and variable angle sample stage to measure the index of refraction, film thickness, film stress, and other optical properties of various material surfaces. Using a dual rotating compensator plate, light is polarized and directed at various angles to the sample surface, which reflects the light with changed properties based on its optical properties. The spectrometer then collects, filters, and measures the intensity of the reflected light at multiple angles and wavelengths. This data is used to calculate the sample's optical properties. High accuracy and repeatability are critical features of RUDOLPH FEVII. The instrument utilizes an advanced motorized sample stage which maintains the incident beam perpendicular with the sample surface at all times. The pressure-controlled system also ensures that no movement of the sample during operation occurs, resulting in precise measurements with repeatability of 0.2nm and better overall accuracy. FE-VII is also equipped with a powerful data analysis package for simplified data manipulation. The software allows for quick and easy measurement results analysis, with data still being saved in raw text format for future analysis in external applications. Specialty packages are also available for phase measurement analysis, taking into account sample film geometry as well as stress and index of refraction. RUDOLPH FE-VII is suitable for a variety of optical and thin-film applications, including metrology, optics design, research and development, industrial manufacturing, quality control, and environmental monitoring. It is also equipped to measure a full range of thin films from atomic layers to millimeters. Its advanced design and features ensure robust and precise component and product measurements.
There are no reviews yet