Used RUDOLPH FE VII #9148236 for sale

RUDOLPH FE VII is an advanced multi-angle automated spectroscopic ellipsometer designed for optical thin-film research and development. It is equipped with advanced optical and data acquisition capabilities to measure the optical characteristics of thin-film structures with a high degree of accuracy and precision. The device utilizes a wavelength-selectable monochromator with UV-visible-NIR spectral coverage from 190 to 1,600 nanometers. The equipment is designed to simulate the optical properties of the sample under different incident angles to accurately characterize the optical properties of the samples. At the heart of RUDOLPH FEVII is the modular automated sample stage that allows automated measurements of up to three samples at once. The robust sample stage features linear motion and high-speed scanning of up to 200 nanometer vertical translation range and 300 nanometer radius rotation range. The linear motion is used to position the samples in an optimal range of incident angles with resolution up to 0.001 degree. The sample stage also allows dual optical polarization for variable angle sample stage scanning. The ellipsometer utilizes an array of beam scanning components to facilitate the automated dual polarization and variable angle measurement of sample optical properties. The system includes a set of light sources such as Tungsten, Xenon or broadband light that can be used to accurately simulate an incident beam at different angles. The unit is equipped with a photodetector array to measure the reflected angles and evaluate the intensity, indices of refraction, and thickness of the sample. The advanced optical and optoelectronic components coupled with FE-VII software make it possible to make accurate angle and intensity scans of samples and simulate the optical properties of the sample. In addition to its automated features, RUDOLPH FE-VII includes an extensive array of calibration and data analysis tools to analyze the data. These include a library of sample and substrate optical properties, a temperature control machine, custom data analysis and reporting tools, and a database of measurement parameters. The user-friendly interface and the extensive technical capabilities make FE VII an ideal solution for optical thin-film research and development.