Used RUDOLPH FE VII #9161281 for sale

RUDOLPH FE VII is a sophisticated and accurate ellipsometer from RUDOLPH Technologies, Inc. used to measure the electronic and optical properties of thin films and surfaces. Its seven (7) different configurations can measure a broad range of parameters, such as the thickness, refractive index, extinction coefficient, surface roughness, resistivity, band gap, and optical constants of thin films. The instrument includes an adjustable sample arm, a highly sensitive detector, and a solid-state laser diode with a wavelength range from 200 to 800nm. RUDOLPH FEVII uses an optical system with a goniometer to measure the optical properties of a sample. The goniometer rotates the light beam from the sample to two detectors located at 90 degrees to one another, allowing for a precise and accurate determination of the sample's optical parameters. An additional polarizing accessory can be added to the system for measuring polarization-based optical parameters. The instrument is pre-programmed with various measurement methods, making it ideal for a range of materials characterization tasks. It offers an intuitive, user-friendly interface with a separate data control window, allowing for easy use and smooth operation. The instrument also features a powerful yet flexible data processing and analysis software that enables users to quickly process data, identify problems and trends, and generate reports. FE-VII is capable of measuring films of thicknesses from 0.2 nm to 1,000 nm and refractive index values up to 4.0. The instrument can also be configured with a standing-wave accessory to measure a range of film thicknesses up to 6,000nm, as well as a wide range of other optical parameters, such as resistivity, band gap energies, dielectric constants, optical constants, surface roughness, and the index of refraction and extinction coefficient. Overall, FEVII is an advanced, robust, and versatile ellipsometer that is perfect for a range of materials characterization processes. Its pre-programmed functions make it easy to use for the most demanding technical applications, while its powerful software allows users to quickly process and analyze data. This makes it an ideal choice for researchers and materials scientists alike.